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Mathematical Models for Systems Reliability

Mathematical Models for Systems Reliability
Authors: Benjamin Epstein, Ishay Weissman
Publisher: Chapman & Hall/CRC
Category: Book

List Price: $79.95
Buy New: $57.00
You Save: $22.95 (29%)



New (10) Used (2) from $57.00

Sales Rank: 1123583

Media: Hardcover
Edition: 1
Number Of Items: 1
Pages: 272
Shipping Weight (lbs): 1.4
Dimensions (in): 9.1 x 6.2 x 0.8

ISBN: 1420080822
Dewey Decimal Number: 620.00452015118
EAN: 9781420080827
ASIN: 1420080822

Publication Date: May 9, 2008
Availability: Usually ships in 1-2 business days
Shipping: Expedited shipping available
Shipping: International shipping available

Accessories:

  • Applied Reliability, Second Edition (Electrical Engineering)
  • Probability, Statistics, and Reliability for Engineers and Scientists, Second Edition
  • Reliability Modelling: A Statistical Approach

Editorial Reviews:

Product Description
Evolved from the lectures of a recognized pioneer in developing the theory of reliability, Mathematical Models for Systems Reliability provides a rigorous treatment of the required probability background for understanding reliability theory.

This classroom-tested text begins by discussing the Poisson process and its associated probability laws. It then uses a number of stochastic models to provide a framework for life length distributions and presents formal rules for computing the reliability of nonrepairable systems that possess commonly occurring structures. The next two chapters explore the stochastic behavior over time of one- and two-unit repairable systems. After covering general continuous-time Markov chains, pure birth and death processes, and transitions and rates diagrams, the authors consider first passage-time problems in the context of systems reliability. The final chapters show how certain techniques can be applied to a variety of reliability problems.

Illustrating the models and methods with a host of examples, this book offers a sound introduction to mathematical probabilistic models and lucidly explores how they are used in systems reliability problems.

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